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High-Throughput Total Internal Reflection Fluorescence and Direct Stochastic Optical Reconstruction Microscopy Using a Photonic Chip
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A method to simulate the optical image from far-field scattering numerical data and its application to the total

Ignacio Iglesias1, Juan Muñoz2, Jaime Colchero1

  • 1Departamento de Física, Universidad de Murcia, Campus de Espinardo, Murcia, Spain.

Journal of Microscopy
|September 15, 2019
PubMed

Keywords:
Computational electrodynamicsmicroscopy image simulationnanowirestotal internal reflection

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