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Wenjing Liu1, Yourong Guo2, Kaizhe Wang1

  • 1Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China. hujun@sinap.ac.cn libin@sinap.ac.cn and University of Chinese Academy of Sciences, Beijing 100049, China.

Nanoscale
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Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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