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Ni-base superalloy single crystal (SX) mosaicity characterized by the Rotation Vector Base Line Electron Back Scatter
P Thome1, S Medghalchi1, J Frenzel1
1Institut für Werkstoffe, Ruhr-Universität Bochum, Universitätsstr. 150, 44801 Bochum, Germany.
Ultramicroscopy
|September 24, 2019
Summary
A new Rotation Vector Base Line Electron Back Scatter Diffraction (RVB-EBSD) method quantifies crystal mosaicity in superalloys. This technique reveals small crystallographic deviations and associated dislocations, aiding material science research.
Area of Science:
- Materials Science
- Crystallography
- Electron Microscopy
Background:
- Studying crystal mosaicity in single crystals is crucial for understanding material properties.
- Existing methods for orientation imaging have limitations in quantifying subtle crystallographic deviations.
Purpose of the Study:
- To introduce and validate the novel Rotation Vector Base Line Electron Back Scatter Diffraction (RVB-EBSD) method.
- To enable the quantification of crystal mosaicity and associated geometrically necessary dislocations (GNDs) in Ni-base superalloy single crystals.
Main Methods:
- Development of the RVB-EBSD technique, building upon cross-correlation EBSD procedures.
- Application of Gaussian band pass filtering to enhance over 500,000 experimental patterns.
- Implementation of a rotation vector approximation and a baseline correction function.
Main Results:
- The RVB-EBSD method successfully quantifies small crystallographic deviation angles between dendrites.
- The technique allows for the interpretation of accommodation processes in terms of geometrically necessary dislocations (GNDs).
- A novel intuitive color-coding system enhances the visualization of crystal mosaicity features.
Conclusions:
- The RVB-EBSD method provides a powerful new tool for correlative orientation imaging in scanning electron microscopy.
- This technique offers significant potential for detailed analysis of crystal mosaicity and defect structures in advanced materials.

