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Dynamic secondary electron emission in rough composite materials.

Leandro Olano1, Maria E Dávila2, John R Dennison3

  • 1Instituto de Ciencia de Materiales de Madrid, CSIC, C/Sor Juana Inés de la Cruz 3, 28049, Madrid, Spain. l.olano@icmm.csic.es.

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|September 29, 2019
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Summary

New composite materials exhibit ultra-low secondary electron emission (SEE) by leveraging a synergy between metal and dielectric domains. This breakthrough could enhance radiofrequency (RF) equipment performance by inhibiting electron avalanches.

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Area of Science:

  • Materials Science
  • Plasma Physics
  • Surface Science

Background:

  • Secondary electron emission (SEE) is a critical phenomenon in materials science, impacting applications from space technology to medical devices.
  • High SEE can lead to detrimental electron avalanches in radiofrequency (RF) equipment, limiting operational power.
  • Existing methods to reduce SEE are insufficient for demanding technological applications.

Purpose of the Study:

  • To investigate the mechanism behind an experimentally observed ultra-low secondary electron emission yield in composite materials.
  • To develop a predictive model for secondary electron emission based on material composition and geometry.
  • To inform the design of novel materials for suppressing electron avalanches in high-power RF systems.

Main Methods:

  • Development of a simplified 3D model featuring parallel, interleaved metallic and dielectric domains with a triangular surface profile.
  • Derivation of a continuous equation to describe the electric field between grounded conductors and charged dielectric domains.
  • Calculation of secondary electron trajectories within the 3D geometry to predict dynamic secondary emission yield.

Main Results:

  • Achieved secondary electron emission yield values below 0.2 up to 1 keV incident electron energy.
  • Demonstrated a strong dependence of the dynamic secondary emission yield on the charge accumulated in dielectric domains.
  • Identified an undocumented synergy between neighboring metal and dielectric domains as the cause for reduced SEE.

Conclusions:

  • The proposed 3D model accurately predicts ultra-low secondary electron emission in composite materials.
  • The synergy between metallic and dielectric domains is key to suppressing secondary electron emission.
  • This research provides a pathway for designing advanced materials to mitigate electron avalanches and enhance RF equipment performance.