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Testing of a MEMS Dynamic Inclinometer Using the Stewart Platform.
Zhihua Liu1, Chenguang Cai2, Ming Yang3
1Division of Mechanics and Acoustics, National Institute of Metrology of China, Beijing 100029, China. liuzhihua@nim.ac.cn.
Sensors (Basel, Switzerland)
|October 2, 2019
Summary
This study introduces a novel method for testing micro-electro-mechanical system (MEMS) dynamic inclinometers using a Stewart platform. The Stewart platform accurately measures gyroscope and tilt sensing sensitivities, showing minimal deviations compared to traditional methods.
Area of Science:
- Instrumentation and Measurement
- Mechanical Engineering
- Robotics
Background:
- Micro-electro-mechanical systems (MEMS) dynamic inclinometers are crucial for real-time tilt measurement.
- Traditional testing methods for inclinometers may have limitations in assessing dynamic performance.
- Stewart platforms offer advanced capabilities for generating complex spatial motions.
Purpose of the Study:
- To investigate the application of spatial orbits generated by a Stewart platform for testing MEMS dynamic inclinometers.
- To determine the sensitivities of gyroscope, accelerometer, and tilt sensing using this novel method.
- To evaluate the cross-coupling influence on tilt angle measurements.
Main Methods:
- Utilized a Stewart platform capable of six degrees of freedom spatial orbits.
- Analyzed inverse and forward kinematics for precise control and measurement of the platform's position and orientation.
- Controlled the Stewart platform to generate conical motion for sensitivity determination.
- Generated spatial positional orbits to assess cross-coupling effects.
Main Results:
- Successfully determined gyroscope, accelerometer, and tilt sensing sensitivities using the Stewart platform.
- Quantified tilt angles influenced by cross-coupling effects through spatial positional orbits.
- Demonstrated low amplitude frequency deviations (<0.2 dB for gyroscope, <0.1 dB for tilt sensing) compared to traditional rotators.
Conclusions:
- The Stewart platform provides a viable and accurate method for testing MEMS dynamic inclinometers.
- This approach offers high precision in determining sensor sensitivities and evaluating cross-coupling influences.
- The method shows comparable or improved accuracy over traditional testing techniques.

