Quasi Single Point Calibration Method for High-Speed Measurements of Resistive Sensors

Area of Science:

• Electrical Engineering
• Sensor Technology
• Embedded Systems

Background:

• Direct interface circuits offer cost-effective digital conversion of sensor readings.
• Accurate calibration of resistive sensors, like two-point calibration method (TPCM) and fast calibration methods (FCMs), often requires significant time, especially for repetitive or large-scale measurements.

Purpose of the Study:

• To develop novel calibration methods that decrease the mean estimation time for resistive sensors.
• To address the time limitations of existing calibration techniques in applications requiring rapid or numerous sensor readings.

Main Methods:

• Proposed several new calibration methods, combining aspects of TPCM, quasi single-point calibration, and fast quasi single-point calibration methods.
• Implemented and validated the proposed methods using a Xilinx XC3S50AN-4TQG144C FPGA circuit.
• Measured resistor values within the range of 267.56 Ω to 7464.5 Ω.

Main Results:

• Achieved significant reductions in estimation times, up to 61% for 20 repetitive measurements.
• Observed only a small increase in relative error, as low as 0.1%.
• Demonstrated the effectiveness of the proposed methods in reducing measurement time for resistive sensors.

Conclusions:

• The proposed calibration methods provide a practical solution for reducing sensor reading estimation times.
• These methods offer a favorable trade-off between reduced time and acceptable error margins.
• The developed techniques are suitable for applications demanding high-speed or high-volume sensor data acquisition.