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A new method for detecting thermal characteristics of slow-wave structure of helix traveling-wave tube using external
1Faculty of Information Technology, School of Microelectronics, Beijing University of Technology, Beijing 100124, China.
Abstract:
This paper presents a method for detecting the heat-dissipation capability of the slow-wave structure (SWS) in a helix traveling wave tube (TWT) using an external heat source. This method utilizes transient temperature rise detection technology and structure function method to nondestructively detect the heat-dissipation capability of SWS. An analytical model is built, and the method is verified by using the simulation tool ANSYS. Furthermore, a dedicated test probe is designed based on this method, and a 2.5-mm diameter helix TWT is measured. The results reveal that the method can effectively detect parts with large thermal resistance in SWS, thereby providing the basis for eliminating the failure products and improving the production process of SWS.
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