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Updated: Jan 5, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Multidimensional luminescence microscope for imaging defect colour centres in diamond
Daniel C Jones1,2,3,4, Sunil Kumar1,2,3,4, Peter M P Lanigan1,2,3,4
1Photonics Group, Imperial College London, London SW7 2AZ, United Kingdom.
Abstract:
We report a multidimensional luminescence microscope providing hyperspectral imaging and time-resolved (luminescence lifetime) imaging for the study of luminescent diamond defects. The instrument includes crossed-polariser white light transmission microscopy to reveal any birefringence that would indicate strain in the diamond lattice. We demonstrate the application of this new instrument to detect defects in natural and synthetic diamonds including N3, nitrogen and silicon vacancies. Hyperspectral imaging provides contrast that is not apparent in conventional intensity images and the luminescence lifetime provides further contrast.
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