Speckle Noise Removal in Image-based Detection of Refractive Index Changes in Porous Silicon Microarrays

Ruyong Ren1, Zhiqing Guo1, Zhenhong Jia2

  • 1College of Information Science and Engineering, Xinjiang University, Urumqi, 830046, China.

Scientific Reports
|October 20, 2019
PubMed

Related Concept Videos