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This study explores chaos in unipolar junction transistor (UJT) oscillators using a new delayed model. The model accurately captures experimental chaotic dynamics, offering insights into complex system behavior.

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Area of Science:

  • Nonlinear Dynamics
  • Chaos Theory
  • Electronic Circuits

Background:

  • Previous work introduced a continuous model for UJT oscillator chaos, drawing parallels to memristors.
  • Experimental observations revealed a transition to chaos via torus breakdown in a modulated UJT oscillator.

Purpose of the Study:

  • To investigate the complex dynamics of a modulated unipolar junction transistor (UJT) oscillator.
  • To develop and validate a new piecewise linear model with delay that accounts for parasitic effects.
  • To explain the experimentally observed transition to chaos through torus breakdown.

Main Methods:

  • Experimental implementation of a modulated relaxation oscillator using a unipolar junction transistor (UJT).
  • Development of a piecewise linear model incorporating a measured parasitic delay effect.
  • Analysis of the model's dimensionality and its ability to reproduce experimental chaotic dynamics.

Main Results:

  • The piecewise linear model with delay successfully replicates the experimentally observed transition to chaos.
  • Inclusion of parasitic delay in the model increases its dimensionality, crucial for capturing complex dynamics.
  • The delayed model exhibits analogies with the leaky integrate-and-fire model used in neurodynamics.

Conclusions:

  • A piecewise linear delayed model provides a more accurate representation of UJT oscillator dynamics than continuous models.
  • Parasitic delay is a key factor in the transition to chaos in this electronic system.
  • The study highlights the connection between nonlinear electronic circuits and neurodynamic models.