IR Spectrometers
Phase Contrast and Differential Interference Contrast Microscopy
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Updated: Jan 5, 2026

Digital Inline Holographic Microscopy DIHM of Weakly-scattering Subjects
Published on: February 8, 2014
Caixia Chang1,2, Zonghua Zhang3,4, Nan Gao5
1State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin 300130, China. ccaixia@foxmail.com.
This study introduces an infrared phase-measuring deflectometry (IR-PMD) method for accurate 3D shape measurement of specular objects. The novel IR-PMD technique overcomes ambient light interference and measures discontinuous surfaces effectively.
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