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Updated: Jan 4, 2026

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
Published on: June 13, 2023
Wen-Fa Zhu1, Xing-Jie Chen2, Zai-Wei Li3
1School of Urban Rail Transportation, Shanghai University of Engineering Science, Shanghai 201620, China. wf-zhu@sues.edu.cn.
A new Multilayer SAFT imaging method accurately detects void defects in ballastless tracks. This advanced technique improves ultrasonic imaging for multilayer structures, enhancing safety and performance assessments.
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