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Updated: Jan 4, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Miguel Tinoco1,2, Louis Maduro1, Sonia Conesa-Boj3
1Kavli Institute of Nanoscience, Delft University of Technology, 2628CJ, Delft, The Netherlands.
Researchers precisely controlled edge sites on molybdenum disulfide (MoS2) nanostructures. Zig-zag (ZZ) edges were shown to exhibit metallic properties, opening doors for advanced electronic applications.
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