Confocal Fluorescence Microscopy
Super-resolution Fluorescence Microscopy
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Jan 4, 2026

A Guide to Structured Illumination TIRF Microscopy at High Speed with Multiple Colors
Published on: May 30, 2016
A novel structured illumination microscopy (SIM) method, SIM-TPT, enhances speed and accuracy for surface profilometry. This technique preserves high-frequency details, enabling measurements on both smooth and rough surfaces.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: