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Real Space Imaging of Topological Edge States in InAs/GaSb and InAs/InGa1-Sb Quantum Wells
Shigeru Kaku1, Tatsuhito Ando1, Junji Yoshino1
1Department of Physics , Tokyo Institute of Technology , Tokyo 152-8550 , Japan.
ACS Nano
|November 2, 2019
Summary
Scanning tunneling microscopy revealed edge states on two-dimensional topological insulator surfaces in InAs/GaSb quantum wells. These edge states, crucial for topological electronics, extended up to 10 nm from the surfaces.
Area of Science:
- Condensed Matter Physics
- Materials Science
- Quantum Mechanics
Background:
- Two-dimensional topological insulators (2D-TIs) are materials with unique electronic properties, including conducting edge states protected by time-reversal symmetry.
- InAs/GaSb and related quantum well systems are promising platforms for realizing 2D-TIs due to their tunable band structures.
Purpose of the Study:
- To investigate the presence and characteristics of edge states on the surfaces of InAs/GaSb and InAs/InGaSb quantum wells.
- To confirm the experimental findings with theoretical electronic structure calculations.
Main Methods:
- Utilizing scanning tunneling microscopy (STM) to measure differential tunneling conductance (dI/dV) profiles.
- Performing k·p-based electronic structure calculations to model the material's behavior.
Main Results:
- STM measurements clearly demonstrated structure-dependent differential tunneling conductance profiles on both (110)-cleaved and (001)-growth surfaces.
- The experimental results provided direct evidence for the formation of edge states on the 2D-TI surfaces.
- k·p calculations confirmed the existence of these edge states and showed they extended approximately 10 nm from the cleaved surfaces.
Conclusions:
- The study successfully identified and characterized edge states in InAs/GaSb-based 2D-TI systems.
- The findings validate the potential of these quantum wells as platforms for exploring topological phenomena.
- The extended range of edge states has implications for device design and fabrication in topological electronics.

