High-resolution manipulation of gold nanorods with an atomic force microscope

The controlled manipulation and precise positioning of nanoparticles on surfaces is a critical requisite for studying interparticle interactions in various research fields including spintronics, plasmonics, and nanomagnetism. We present here a method where an atomic force microscope operating in vacuum is used to accurately rotate and displace CTAB-coated gold nanorods on silica surfaces. The method relies on operating an AFM in a bimodal way which includes both dynamic and contact modes. Moreover, the phase of the oscillating probe is used to monitor the nanoparticle trajectory, which amplitude variations are employed to evaluate the energy dissipation during manipulation. The nanoscale displacement modes involve nanorod in-plane rotation and sliding, but no rolling events. The transitions between these displacement modes depend on the angle between the scan axis direction and the nanorod long axis. The findings reveal the importance of mean tip-substrate distance and of oscillation amplitude of the tip. The role of substrate surface and of CTAB molecular bi-layer at nanorod surface is also discussed.