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CryoEM at 100 keV: a demonstration and prospects
K Naydenova1, G McMullan1, M J Peet1
1MRC Laboratory of Molecular Biology, Cambridge CB2 0QH, England.
Iucrj
|November 12, 2019
Summary
Investigating 100 kV electron energy for single-particle cryo-electron microscopy (cryoEM) shows promise for cost savings and improved imaging. This lower energy offers more information per unit of radiation damage, crucial for biological specimens.
Area of Science:
- Structural Biology
- Biophysics
- Microscopy
Background:
- Current single-particle cryo-electron microscopy (cryoEM) typically uses higher electron energies (200-300 keV).
- Lower electron energies (e.g., 100 keV) are predicted to offer an improved information-to-damage ratio for biological samples.
- Existing cryoEM instruments in the 100-120 keV range are not optimized for cryoEM's specific requirements, such as high-defocus imaging and specialized detectors.
Purpose of the Study:
- To investigate the feasibility and potential of operating single-particle cryo-electron microscopy at 100 kV.
- To assess the resolution achievable with 100 kV electron energy for various biological macromolecules.
- To identify current technological limitations and practical advantages of 100 kV cryoEM.
Main Methods:
- A standard commercial 200 kV field-emission gun (FEG) microscope was operated at 100 kV.
- A side-entry cryoholder was utilized for sample preparation and imaging.
- A commercial hybrid pixel camera, typically used for X-ray detection, was adapted for low-dose 100 keV electron imaging.
Main Results:
- Five diverse single-particle specimens (hepatitis B virus capsid, bacterial ribosome, catalase, HSP, hemoglobin) were successfully imaged.
- Reconstructions of 3D structures were achieved with resolutions ranging from 8.4 Å to 3.4 Å.
- The study demonstrated the capability of obtaining high-resolution data at 100 kV despite using non-standard detector configurations.
Conclusions:
- Single-particle cryoEM at 100 kV is a viable approach, offering potential benefits in cost and imaging quality.
- Current technological limitations, particularly in detector technology and illumination coherence, need to be addressed for widespread adoption.
- This work supports the development of future cryoEM instruments optimized for lower voltages, aiming for more accessible structure determination.
Keywords:
advances in microscope hardwaredirect detectorselectron cryomicroscopylow-dose electron microscopysingle-particle cryoEMsingle-particle reconstructionstructure determination
