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Updated: Jan 3, 2026

Atom Probe Tomography Studies on the CuIn,GaSe2 Grain Boundaries
Published on: April 22, 2013
3D nanostructural characterisation of grain boundaries in atom probe data utilising machine learning methods.
Ye Wei1, Zirong Peng1, Markus Kühbach1
1Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Straße 1, Düsseldorf, Germany.
This study introduces a new method combining boosting, Hough transformation, and principal component analysis to automatically track grain boundaries in atom probe data. This approach significantly improves efficiency and accuracy over manual analysis.
Area of Science:
- Materials Science
- Computational Materials Science
- Data Analysis
Background:
- Boosting algorithms are effective for object tracking in video analysis.
- Manual extraction of grain boundary information from atom probe data is time-consuming and prone to errors.
Purpose of the Study:
- To develop an automated method for extracting grain boundary location and trace from atom probe data.
- To combine boosting trackers with Hough transformation and principal component analysis for enhanced data analysis.
Main Methods:
- Implementation of a boosting tracker algorithm.
- Application of Hough transformation for feature detection.
- Utilizing principal component analysis for data dimensionality reduction.
- Analysis of atom probe data from pure aluminum bi-crystal and simulated datasets.
Main Results:
- Successful automated extraction of grain boundary location and trace.
- Demonstrated effectiveness on experimental and simulated atom probe data.
- Near-atomic resolution 3D characterization of grain boundaries.
Conclusions:
- The developed method provides an efficient and accurate alternative to manual analysis.
- Enables comprehensive 5-degree-of-freedom grain boundary characterization.
- Facilitates extraction of local atomic compositional and geometric information at interfaces.
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