Discrete scattering by a pair of parallel defects
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Updated: Jan 3, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Basant Lal Sharma1, Gaurav Maurya1
1Department of Mechanical Engineering, Indian Institute of Technology Kanpur, Kanpur, India.
Abstract:
Scattering of a time-harmonic anti-plane shear wave due to either a pair of crack tips or a pair of rigid constraint tips on square lattice is considered. The two problems correspond to the so-called zero-offset case of scattering due to a pair of identical Sommerfeld screens. The peculiar structural symmetry allows the reduction of coupled equations to two scalar Wiener-Hopf equations and a total of four geometrically reduced problems on lattice half-plane. Exact solution of each problem for incidence from the bulk lattice, as well as from an associated lattice waveguide, is constructed. A suitable superposition of the four expressions is used to construct the solution of the main problem. The discrete paradigm involving the wave mode incident from the waveguide is relevant for modern applications where an investigation of mechanisms of electronic and thermal transport at nanoscale remains an interesting problem. This article is part of the theme issue 'Modelling of dynamic phenomena and localization in structured media (part 2)'.
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