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Updated: Jan 3, 2026

Additive Manufacturing-Enabled Low-Cost Particle Detector
Published on: March 24, 2023
Single-pass non-destructive electronic detection of charged particles
Markus Kiffer1, Stefan Ringleb1, Nils Stallkamp1
1Friedrich Schiller-Universität Jena, 07743 Jena, Germany.
Researchers developed a new method and detector for simultaneously measuring charged particle bunch properties like number, energy, and length without damage. This technique uses cryogenic, low-noise amplification for precise measurements of ion beams.
Area of Science:
- Physics
- Particle Accelerators
- Instrumentation
Background:
- Accurate characterization of charged particle bunches is crucial for various applications.
- Existing methods may be destructive or lack simultaneous measurement capabilities.
- Understanding ion bunch properties informs beam dynamics and experimental outcomes.
Purpose of the Study:
- To develop a simultaneous, nondestructive method for determining ion number, kinetic energy, and bunch length.
- To design and build a sensitive electronic detector for this purpose.
- To demonstrate the method's efficacy with experimental ion beams.
Main Methods:
- Devised an experimental setup for simultaneous measurement.
- Utilized a novel electronic detector based on induced charges.
- Employed low-noise amplification at cryogenic temperatures.
- Conducted measurements on low-energy, highly charged ion bunches.
Main Results:
- Successfully demonstrated simultaneous, nondestructive determination of ion bunch parameters.
- Validated the performance of the cryogenic, low-noise detector.
- Obtained precise measurements for ion number, kinetic energy, and bunch length.
Conclusions:
- The developed method and apparatus are capable of precise characterization of charged particle bunches.
- The detector shows promise for various applications requiring sensitive beam diagnostics.
- Further optimization can enhance sensitivity and expand application scope.
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