Impact of additional polishing method on physical, micromorphological, and microtopographical properties of...

The objective of this study was to evaluate the surface roughness (SR), contact angle (CA), depth distribution of the charge particles (DDCP), mapping of chemical elements, 3D microtopography (3DM), and the micromorphology of the composites (MOR) of conventional and bulk fill after additional polishing. The specimens were prepared from Filtek Bulk Fill (FBF), Tetric N-Ceram Bulk Fill (TNCBF), Opus Bulk Fill (OBF), X-tra Fil (XTFL), Filtek Z250 XT (XT), Grandioso (GRA), Tetric N-Ceram (TNC), Vittra APS (VT), according to three additional techniques (n = 10): without finishing and polishing, finishing and polishing with abrasive rubbers (Astropol), finishing and polishing with Astropol plus additional polishing with silicon carbide brush. The SR and CA were measured using a profilometer and adapted goniometer, respectively; 3DM used atomic force microscopy (AFM); the micromorphology and DDCP by scanning electron microscopy (SEM) and the MOR by means of X-ray dispersive energy spectroscopy (EDS). The SR and CA were analyzed by ANOVA-two factors and Tukey test (p < .05); the others data were analyzed descriptively. The DDCP of all the resins had an organic matrix rich surface layer and a particulate rich subsurface layer of smaller dimensions. Additional polishing: reduced SR of FBF, VT, TNCBF, and XTFL resins; increased the CA value of the XTFL and decreased of XT. In the analyzes for 3DM, smoother and more uniform surfaces were observed in all a resins. The elements: carbon (predominant), oxygen, silicon, zirconia, and aluminum were present in all composite resins. Therefore, additional polishing improved the surface properties of the resins studied.