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A high angle scattering, stable amorphous metal TEM specimen for measuring the information envelop of electron
1CAMTEC, MENG, University of Victoria, British Columbia, V8W 2Y2 Canada.
Abstract:
An amorphous metal (a-metal) TEM specimen suitable for measuring the information envelop of (S)TEM electron microscopes is presented. Its features include producing high angle electron scattering intensities and having good structural stability compared with commonly used specimens of amorphous carbon (a-C) and Au islands supported on a-C substrate.
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