Quantitative Evaluation of Bone Microstructure using High-Resolution Extremity Cone-Beam CT with a CMOS Detector

S Subramanian1, M Brehler1, Q Cao1

  • 1Department of Biomedical Engineering, Johns Hopkins University, Baltimore, MD USA.

Summary

A new complementary metal-oxide-semiconductor (CMOS) detector significantly improves cone-beam CT (CBCT) for imaging bone microstructure. This advanced system offers faster scans and more accurate measurements of trabecular bone, aiding in the assessment of skeletal health.