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Updated: Jan 2, 2026

Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon
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Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon

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Calibration of Germanium Resistors at Low Temperatures (2-20° Kelvin)

G Cataland1, H H Plumb1

  • 1Institute for Basic Standards, National Bureau of Standards, Washington, D.C.

Journal of Research of the National Bureau of Standards. Section A, Physics and Chemistry
|December 12, 2019
PubMed

Keywords:
Calibrationgermanium resistorslow temperaturessecondary thermometersthermometry

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