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Akio Yoneyama1,2, Masahide Kawamoto3, Rika Baba4
1SAGA Light Source, 8-7 Yayoigaoka, Tosu, 841-0005, Japan. yoneyama@saga-ls.jp.
This study introduces a new method for effective atomic number (Zeff) imaging using back-scattered X-rays. This technique allows for deep internal material analysis from front-side observation, overcoming limitations of traditional X-ray fluorescence analysis.
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