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Evaluation of serial crystallographic structure determination within megahertz pulse trains
Oleksandr Yefanov1, Dominik Oberthür1, Richard Bean2
1Center for Free-Electron Laser Science, Deutsches Elektronen Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany.
Structural Dynamics (Melville, N.Y.)
|December 14, 2019
Summary
The European X-ray Free-Electron Laser (XFEL) delivers high-repetition rate X-ray pulses. Structural analysis confirms no significant differences or radiation damage between pulses, ensuring data integrity.
Area of Science:
- Structural biology
- X-ray science
- Materials science
Background:
- The European X-ray Free-Electron Laser (XFEL) enables high-repetition rate X-ray experiments.
- A key concern is potential radiation damage or systematic effects from high pulse rates on structural data.
Purpose of the Study:
- To investigate structural integrity and data quality using the European XFEL's megahertz pulse repetition rate.
- To determine if high pulse rates induce radiation damage or systematic errors in structural analysis.
Main Methods:
- Collected structural data from the first and subsequent pulses within the European XFEL pulse train.
- Analyzed and compared structures derived from different pulse positions.
Main Results:
- No significant structural differences were observed between structures determined from the first pulse and subsequent pulses.
- Data quality remained consistent across pulses, indicating no systematic effects or radiation damage under current operating conditions.
Conclusions:
- The European XFEL's high pulse repetition rate does not compromise structural integrity or data quality.
- Current operating conditions at the European XFEL are suitable for reliable atomic resolution structure determination without adverse effects from pulse rate.
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