Simulation Informed CAD for 3D Nanoprinting.

Area of Science:

• Materials Science and Engineering
• Nanotechnology
• Additive Manufacturing

Background:

• Focused Electron Beam-Induced Deposition (FEBID) is a 3D nanoprinting technique for creating nanoscale objects.
• FEBID is limited by non-linear distortions, restricting the complexity and accuracy of deposited geometries.
• Existing Computer-Aided Design (CAD) methods for FEBID rely on linear nanowires, which are susceptible to bending.

Purpose of the Study:

• To develop a method to prevent non-linear nanowire bending during FEBID.
• To enable accurate geometric synthesis of complex 3D nanoscale structures.
• To compensate for implicit beam heating effects inherent in the FEBID process.

Main Methods:

• Derivation of an analytical model based on simulation results and experimental calibration.
• The model accounts for critical mass balance and beam heating effects.
• Integration of the physics-based model into an existing 3D nanoprinting CAD program to adjust exposure files and scanning speeds.

Main Results:

• Successful derivation of an analytical model to ensure linear nanowire deposition in FEBID.
• The model compensates for non-linear distortions caused by beam heating.
• Demonstrated strategy for integrating the model into CAD software for improved 3D nanoprinting accuracy.

Conclusions:

• The developed analytical model effectively ensures nanowire linearity during FEBID.
• This advancement overcomes limitations in FEBID, allowing for more complex and precise 3D nanoscale object fabrication.
• The method enhances the geometric fidelity and potential applications of FEBID-generated structures.