Related Experiment Video
Updated: Jan 1, 2026

X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells
Published on: August 20, 2019
A von Hamos-type hard X-ray spectrometer at the PETRA III beamline P64
Aleksandr Kalinko1, Wolfgang A Caliebe2, Roland Schoch1
1Department Chemie and Center for Sustainable Systems Design (CSSD), Universität Paderborn, Warburger Straße 100, 33098 Paderborn, Germany.
Abstract:
The design and performance of the high-resolution wavelength-dispersive multi-crystal von Hamos-type spectrometer at PETRA III beamline P64 are described. Extended analyzer crystal collection available at the beamline allows coverage of a broad energy range from 5 keV to 20 keV with an energy resolution of 0.35-1 eV. Particular attention was paid to enabling two-color measurements by a combination of two types of analyzer crystals and two two-dimensional detectors. The performance of the spectrometer is demonstrated by elastic-line and emission-line measurements on various compounds.
More Related Videos
10:12Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
10:03Proton Transfer and Protein Conformation Dynamics in Photosensitive Proteins by Time-resolved Step-scan Fourier-transform Infrared Spectroscopy
Published on: June 27, 2014