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High-performance optical differentiation wavefront sensing towards freeform metrology.

Biswa Ranjan Swain, Christophe Dorrer, Jie Qiao

    Optics Express
    |December 25, 2019
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    Summary

    This study introduces a novel optical differentiation wavefront sensor for precise freeform optics metrology. The technique accurately characterizes freeform phase plates, demonstrating robust performance even with noise.

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    Area of Science:

    • Optical metrology
    • Wavefront sensing
    • Freeform optics

    Background:

    • Accurate characterization of freeform optical components is crucial for advanced optical systems.
    • Existing metrology techniques may face limitations with complex wavefront slopes inherent in freeform optics.

    Purpose of the Study:

    • To demonstrate a novel optical differentiation wavefront sensor for metrology of freeform optics.
    • To evaluate the accuracy and precision of the proposed sensor for characterizing freeform phase plates.

    Main Methods:

    • Utilizing an optical differentiation wavefront sensor with spatially dithered binary pixel distributions.
    • Synthesizing a far-field amplitude filter using pixelated filters with 2.5-µm pixels.
    • Comparing experimental results with a commercial low-coherence-length interferometer.

    Main Results:

    • Accurate characterization of freeform phase plates with varying wavefront slopes was achieved.
    • Root-mean-square (RMS) accuracy of approximately λ/10 and precision of approximately λ/70 at 633 nm were obtained.
    • Simulations confirmed the robustness of the wavefront-sensing approach against photodetection noise and filter nonlinearity.

    Conclusions:

    • The demonstrated optical differentiation wavefront sensor offers a viable and accurate method for freeform optics metrology.
    • The technique shows promise for characterizing complex optical surfaces in demanding applications.
    • The sensor's robustness suggests suitability for real-world optical testing environments.