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Using Tomoauto: A Protocol for High-throughput Automated Cryo-electron Tomography
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Versatile inversion tool for phaseless optical diffraction tomography.

Kevin D Unger, Patrick C Chaumet, Guillaume Maire

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    This study introduces a simplified method for 3D complex permittivity estimation using optical Fourier ptychography microscopy, avoiding complex interferometric measurements. The new approach significantly simplifies tomographic diffraction microscope (TDM) implementation.

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    Area of Science:

    • Microscopy and Imaging
    • Materials Science
    • Computational Optics

    Background:

    • Classical tomographic diffraction microscopes (TDMs) require complex interferometric measurements.
    • Estimating a sample's 3D complex permittivity is crucial for material characterization.

    Purpose of the Study:

    • To develop a general inversion scheme for estimating 3D complex permittivity from image plane intensity data.
    • To simplify the implementation of tomographic diffraction microscopy.

    Main Methods:

    • Utilizing optical Fourier ptychography microscopy to record intensity data at various illumination angles.
    • Developing and testing a general inversion scheme applicable to diverse microscope configurations and scattering regimes.
    • Comparing reconstructions from phaseless and complex data with established TDM methods.

    Main Results:

    • The proposed inversion scheme successfully estimates 3D complex permittivity.
    • The method is versatile, applicable to transmission/reflection microscopes, low/high numerical apertures, and single/multiple scattering.
    • Phaseless data reconstructions closely match those from complex data in most cases.

    Conclusions:

    • A general inversion scheme for 3D complex permittivity estimation is presented.
    • This method offers a significant simplification for tomographic diffraction microscope implementation.
    • The use of phaseless data demonstrates the potential for easier experimental setups.