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Deep neural network based calibration for freeform surface misalignments in general interferometer.

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    A novel deep neural network (DNN) method accurately calibrates optical freeform surface misalignments. This approach overcomes traditional limitations, enabling precise aberration estimation and removal for improved testing accuracy.

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    Area of Science:

    • Optical Engineering
    • Metrology
    • Surface Metrology

    Background:

    • Interferometric testing of optical freeform surfaces presents significant challenges in calibrating misalignment aberrations.
    • Complex surface figures and six-axis degrees of freedom lead to non-linear aberration variations with minor misalignments.
    • Traditional methods like the sensitive matrix approach lack precision in non-linear regimes.

    Purpose of the Study:

    • To introduce a deep neural network (DNN)-based method for accurate calibration of surface misalignment aberrations in optical freeform testing.
    • To address the limitations of traditional methods in handling non-linear aberration variations.
    • To demonstrate the feasibility and accuracy of the proposed DNN-based calibration technique.

    Main Methods:

    • A deep neural network (DNN) was trained to learn the non-linear relationship between surface misalignments and aberrations.
    • Ray tracing simulations were used to predict misalignment aberrations based on estimated misalignments.
    • Wavefront data subtraction was employed to remove the predicted aberrations.

    Main Results:

    • The DNN-based method accurately estimates non-linear misalignment aberrations, surpassing traditional techniques.
    • Simulated and experimental results confirm the effectiveness of the DNN approach.
    • The method allows for precise calibration and correction of aberrations caused by surface misalignments.

    Conclusions:

    • The proposed DNN-based calibration method is a feasible and accurate solution for addressing misalignment aberrations in optical freeform surface testing.
    • This technique offers a significant improvement over traditional methods, particularly for complex, non-linear scenarios.
    • The study highlights the potential of machine learning in advancing optical metrology.