Related Experiment Video
Updated: Jan 1, 2026

Characterizing Far-infrared Laser Emissions and the Measurement of Their Frequencies
Published on: December 18, 2015
Calibration of high-accuracy spectrometers using stabilized 11-GHz femtosecond semiconductor laser
Abstract:
We demonstrate for the first time the calibration of the wavelength scale of high-performance spectrometers using a fully stabilized optical frequency comb from an ultrafast optically pumped semiconductor disk laser (SDL) as a traceable reference. The SDL is a modelocked integrated external-cavity surface-emitting laser (MIXSEL) with the gain and saturable absorber layers fully integrated into one wafer chip, which forms one end mirror of the simple straight cavity with a pulse repetition rate of 11 GHz. This MIXSEL comb is actively stabilized and opens new possibilities for easier and more accurate frequency calibrations of standard laboratory instruments.
More Related Videos
09:49An Experimental Protocol for Femtosecond NIR/UV - XUV Pump-Probe Experiments with Free-Electron Lasers
Published on: October 23, 2018
08:48Low-cost Custom Fabrication and Mode-locked Operation of an All-normal-dispersion Femtosecond Fiber Laser for Multiphoton Microscopy
Published on: November 22, 2019