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Updated: Jan 1, 2026

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
Published on: January 26, 2016
Single trace terahertz spectroscopic ellipsometry
Abstract:
A new technique for terahertz time-domain ellipsometry is presented. Information of reflection coefficients of the sample in two orthogonal polarizations is encoded on the same terahertz trace by using a birefringent medium. This allows for single measurement refractive index extraction without the need for a moving analyzer. A comparison of the complex refractive index measurements of optical grade fused silica and non birefringent sapphire are carried out both in reflection ellipsometry and with a standard terahertz transmission spectrometer showing good agreement.
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