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Three-dimensional Super Resolution Microscopy of F-actin Filaments by Interferometric PhotoActivated Localization Microscopy iPALM

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Structured Back Focal Plane Interferometry (SBFPI).

Avinash Upadhya¹, Yujie Zheng¹, Li Li²

¹Research School of Electrical, Energy, and Materials Engineering, College of Engineering and Computer Science, The Australian National University, Canberra, ACT 2601, Australia.

Scientific Reports

|January 1, 2020

Summary

This summary is machine-generated.

Structured Back Focal Plane Interferometry (SBFPI) enhances particle tracking precision. This novel technique extends detection range and sensitivity while maintaining robustness against optical aberrations for high-speed applications.

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Area of Science:

Optical Physics
Nanotechnology
Metrology

Background:

Back focal plane interferometry (BFPI) offers high-speed, sub-nanometer particle tracking.
Conventional BFPI has limitations in tunable detection range, sensitivity, and aberration resilience.

Purpose of the Study:

To develop a tunable BFPI technique with extended linear detection range and maintained sensitivity.
To enhance robustness against optical aberrations in high-speed particle tracking.

Main Methods:

Introduced Structured Back Focal Plane Interferometry (SBFPI) using a structured beam (conical wavefront) and structured detection (annular quadrant photodiode).
Investigated the SBFPI parameter space to tune detection sensitivity and range.
Evaluated resilience against asymmetric spatial aberrations like astigmatism.

Main Results:

SBFPI demonstrated extended tracking range with minimal loss in sensitivity.
The technique showed resilience against astigmatism up to 0.8 λ.
A figure of merit was identified for optimizing SBFPI configurations balancing range and sensitivity.

Conclusions:

SBFPI offers a tunable, robust, and sensitive method for high-speed particle tracking.
The technique preserves key optical properties for compatibility with conventional BFPI systems.
SBFPI is poised to advance optical detection, interferometry, and force spectroscopy.