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Updated: Dec 31, 2025

Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
Jiaye He1,2,3, Jan Huisken4,5
1Morgridge Institute for Research, 330 N Orchard St, Madison, WI, 53715, USA.
This study introduces a smart rotation workflow for Selective Plane Illumination Microscopy (SPIM). It optimizes light sheet imaging orientations using on-the-fly analysis, improving sample coverage and reducing data and phototoxicity.
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