Time-resolved diffraction with an optimized short pulse laser plasma X-ray source
M Afshari1, P Krumey1, D Menn1
1Faculty of Physics and Center for Nanointegration Duisburg-Essen, University of Duisburg-Essen, Lotharstrasse 1, 47048 Duisburg, Germany.
Structural Dynamics (Melville, N.Y.)
|January 15, 2020
Summary
We developed a flexible, time-resolved X-ray diffraction setup using a laser-driven plasma source. This system enables high-resolution studies of dynamic material changes, like laser-induced strain waves.
Area of Science:
- Materials Science
- Condensed Matter Physics
- X-ray Optics
Background:
- Time-resolved X-ray diffraction (TRXRD) is crucial for studying dynamic material processes.
- Existing TRXRD setups often lack flexibility and require specialized configurations.
- Advancements in X-ray sources are needed to improve resolution and data acquisition rates.
Purpose of the Study:
- To present a modular and adaptable setup for time-resolved X-ray diffraction.
- To optimize the system for high angular and momentum resolution using a laser-driven plasma X-ray source.
- To demonstrate the capability for high dynamic range measurements of transient material phenomena.
Main Methods:
- Utilized a short-pulse, laser-driven plasma X-ray source.
- Employed Ti K-alpha (4.51 keV) radiation from a Ti wire target.
- Integrated a toroidally bent crystal for X-ray collection, monochromatization, and focusing.
- Operated the system at a 10 Hz repetition rate.
Main Results:
- Achieved high angular/momentum resolution for TRXRD experiments.
- Delivered 10^7 Ti K-alpha photons per pulse with a relative bandwidth of 10^-4.
- Enabled high dynamic range (10^4) measurements of transient changes.
- Successfully measured laser-triggered strain waves in materials.
Conclusions:
- The presented modular TRXRD setup offers high flexibility for diverse applications.
- The system's optimization provides excellent resolution and sensitivity for dynamic material studies.
- This approach facilitates the investigation of ultrafast phenomena in materials with high precision.


