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Updated: Dec 30, 2025

Stress Distribution During Cold Compression of Rocks and Mineral Aggregates Using Synchrotron-based X-Ray Diffraction
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Evidence of Stress Development as a Source of Driving Force for Grain-Boundary Migration in a Ni Bicrystalline TEM

Sung Bo Lee1, Jinwook Jung1, Heung Nam Han1

  • 1Department of Materials Science and Engineering and Research Institute of Advanced Materials (RIAM), Seoul 08826, Korea.

Materials (Basel, Switzerland)
|January 17, 2020
PubMed

Keywords:
grain-boundary migrationnickelstacking faultstress developmenttransmission electron microscopy (TEM)

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