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Updated: Dec 30, 2025

Scanning-probe Single-electron Capacitance Spectroscopy
Published on: July 30, 2013
Direct measurement of electrostatic potentials at the atomic scale: A conceptual comparison between electron
Florian Winkler1, Juri Barthel1, Rafal E Dunin-Borkowski2
1Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C), Forschungszentrum Jülich, Jülich 52425, Germany.
Abstract:
Off-axis electron holography and first moment STEM are sensitive to electromagnetic potentials or fields, respectively. In this work, we investigate in what sense the results obtained from both techniques are equivalent and work out the major differences. The analysis is focused on electrostatic (Coulomb) potentials at atomic spatial resolution. It is shown that the probe-forming/objective aperture strongly affects the reconstructed electrostatic potentials and that, as a result of the different illumination setups, dynamical diffraction effects show a specific response with increasing specimen thickness. It is shown that thermal diffuse scattering is negligible for a wide range of specimen thicknesses, when evaluating the first moment of diffraction patterns.
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