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Updated: Dec 30, 2025

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Zhenzhen Hui1, Xuzhong Zuo2, Longqiang Ye1
1College of Chemistry and Materials Engineering, Anhui Science and Technology University, Fengyang 233100, China.
Controlling chromium nitride (CrN) thin film thickness tunes microstructure and electrical properties. Thicker films show increased grain size and nitrogen content, leading to lower resistivity and magnetoresistance, with potential for sensitive magnetic field detection.
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