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Analysis of Channel Area Fluctuation Effects of Gate-All-Around Tunnel Field-Effect Transistor

Seok Jung Kang1, Jeong-Uk Park1, Kyung Jin Rim1

  • 1Department of Electrical and Computer Engineering, Ajou University, Suwon 16499, Republic of Korea.

Journal of Nanoscience and Nanotechnology
|January 24, 2020
PubMed

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