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Reflection of an ultrasonic wave on the bone-implant interface: Comparison of two-dimensional and three-dimensional
Yoann Hériveaux1, Guillaume Haïat1, Vu-Hieu Nguyen2
1Centre National de la Recherche Scientifique, Laboratoire Modélisation et Simulation Multi Echelle, Unité Mixte de Recherche 8208 CNRS, 61 avenue du Général de Gaulle, 94010 Créteil Cedex, France.
Abstract:
Quantitative ultrasound is used to characterize osseointegration at the bone-implant interface (BII). However, the interaction between an ultrasonic wave and the implant remains poorly understood. Hériveaux, Nguyen, and Haiat [(2018). J. Acoust. Soc. Am. 144, 488-499] recently employed a two-dimensional (2D) model of a rough BII to investigate the sensitivity of the ultrasonic response to osseointegration. The present letter aimed at assessing the validity of the 2D assumption. The values of the reflection coefficient of the BII obtained with two and three-dimensional models were found not to be significantly different for implant roughness lower than 20 μm. 2D modeling is sufficient to describe the interaction between ultrasound and the BII.
