Electro-mechanical Systems
LC Circuits
Semiconductors
Modeling of Diode Forward Characteristics
Mechanistic Models: Compartment Models in Algorithms for Numerical Problem Solving
Small-signal Diode Model
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Design and Optimization Strategies of a High-Performance Vented Box
Published on: June 9, 2023
Stephen Y Chen1, Odile Marcotte2, Mario Leonardo Morfin Ramírez3
11School of Information Technology, York University, 3068 TEL Building, 4700 Keele Street, Toronto, M3J 1P3 Canada.
This study addresses complex electronic circuit board (ECB) test planning. Solutions for subproblems significantly improve testing efficiency compared to current methods.
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