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Related Concept Videos

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

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Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used....
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AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
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In inductively coupled plasma–mass spectrometry (ICP–MS), an inductively coupled plasma (ICP) torch is used as an atomizer and ionizer. Solid samples are dissolved and volatilized before being introduced into the high-temperature argon plasma, while solution samples are nebulized and passed through the high-temperature argon plasma. Plasma dissociates the analytes and ionizes their component atoms to form a mixture of positive ions and molecular species. The positive ions are then...
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The resolution of a mass spectrometer depends on the efficiency of separating ions with different ion masses. The mass of an atom is approximated to the sum of the masses of protons and neutrons inside, considering the masses of protons and neutrons as equal. However, the masses of the proton (1.6726 × 10−24 g) and neutron (1.6749 × 10−24 g) are not truly equal. There is a minor error in the expression of atomic masses relative to the simplest atom of hydrogen. For...
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The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
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Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle01:19

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Inductively coupled plasma (ICP) is the most widely used plasma source in atomic emission spectroscopy (AES), also known as Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES). The ICP source, or torch, consists of three concentric quartz tubes with argon gas flowing through them. A spark from a Tesla coil initiates the ionization of argon, generating a high-temperature plasma.
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ECRIS plasma spectroscopy with a high resolution spectrometer.

R Kronholm1, T Kalvas1, H Koivisto1

  • 1Department of Physics, University of Jyväskylä, 40500 Jyväskylä, Finland.

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Optical emission spectroscopy with a high-resolution spectrometer characterizes Electron Cyclotron Resonance Ion Source (ECRIS) plasmas. Diagnostics reveal plasma conditions change significantly without extraction voltage, impacting ion currents and temperatures.

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Area of Science:

  • Plasma Physics
  • Atomic and Molecular Physics
  • Ion Source Technology

Background:

  • Electron Cyclotron Resonance Ion Source (ECRIS) plasmas are crucial for producing highly charged ions.
  • Characterizing these plasmas noninvasively is essential due to high electron energies and ion charges.
  • Optical emission spectroscopy (OES) is a primary noninvasive diagnostic technique.

Purpose of the Study:

  • To develop and utilize a high-resolution spectrometer for detailed ECRIS plasma characterization.
  • To investigate the influence of operational parameters, such as extraction voltage and microwave modulation, on plasma properties.
  • To determine ion temperatures and explore methods for their reduction.

Main Methods:

  • Development of a high-resolution spectrometer (10 pm FWHM at 632 nm) for detecting weak emission lines.
  • Application of OES to probe densities of ions, neutral atoms, and cold electron temperatures in the JYFL 14 GHz ECRIS.
  • Measurement of ion temperatures via Doppler broadening of emission lines, accounting for instrumental broadening.
  • Comparative studies of continuous wave (CW) and amplitude modulation (AM) microwave injection modes.

Main Results:

  • Cold electron temperature dropped from 40 eV to 20 eV when extraction voltage was switched off, correlating with a two-order decrease in Ar$^{9+}$ emission.
  • Ion currents in CW mode may be limited by diffusion and electrostatic confinement, not extraction region beam formation.
  • Measured ion temperatures ranged from 5 to 28 eV, varying with plasma species and charge state.
  • Gas mixing (e.g., Ar with O2) effectively reduced high charge state argon ion temperature from 20 eV to 5 eV.

Conclusions:

  • ECRIS plasma diagnostics without extraction voltage do not represent normal operating conditions.
  • Diffusion and electrostatic confinement are significant factors in ion current limitations during CW operation.
  • Gas mixing is a viable strategy for reducing ion temperatures in high charge state ion beams.
  • The developed high-resolution spectrometer enables precise ion temperature measurements through Doppler broadening analysis.