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An automatic estimation of the ridge parameter for extreme learning machine.

Shraddha M Naik1, Ravi Prasad K Jagannath2, Venkatanareshbabu Kuppili1

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Area of Science:

  • Machine Learning
  • Computational Intelligence
  • Neural Networks

Background:

  • Extreme Learning Machine (ELM) offers computational efficiency and fast training.
  • ELM's real-time application often requires a ridge parameter (C) for ill-posed linear systems.
  • Current methods for estimating C, like generalized cross-validation, are computationally expensive.

Purpose of the Study:

  • To propose time-efficient methods for automatic ridge parameter estimation in ELM.
  • To enhance generalization performance and computational speed for real-time ELM applications.
  • To evaluate the effectiveness of L-curve and U-curve techniques for ridge parameter selection.

Main Methods:

  • Developed novel methods utilizing L-curve and U-curve techniques for automatic ridge parameter estimation.
  • Applied proposed methods to benchmark binary and multiclass classification datasets.
  • Compared performance against existing methods using metrics like accuracy, precision, and F1-score.

Main Results:

  • Proposed L-curve and U-curve methods effectively estimate the ridge parameter, even for large datasets.
  • The new methods demonstrate superior performance in accuracy, precision, sensitivity, specificity, F1-score, and computational time.
  • Statistical analysis using the Friedman ranking test confirms the proposed methods' effectiveness and superiority over existing techniques.

Conclusions:

  • The L-curve and U-curve techniques provide a computationally efficient and accurate approach to automatic ridge parameter selection in ELM.
  • These methods offer significant improvements in generalization performance and speed for real-time machine learning tasks.
  • The proposed techniques represent a valuable advancement for the practical application of Extreme Learning Machines.