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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Dimensionality-Mediated Semimetal-Semiconductor Transition in Ultrathin PtTe_{2} Films
Meng-Kai Lin1,2, Rovi Angelo B Villaos3, Joseph A Hlevyack1,2
1Department of Physics, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA.
Abstract:
Platinum ditelluride (PtTe_{2}), a type-II Dirac semimetal, remains semimetallic in ultrathin films down to just two triatomic layers (TLs) with a negative gap of -0.36 eV. Further reduction of the film thickness to a single TL induces a Lifshitz electronic transition to a semiconductor with a large positive gap of +0.79 eV. This transition is evidenced by experimental band structure mapping of films prepared by layer-resolved molecular beam epitaxy, and by comparing the data to first-principles calculations using a hybrid functional. The results demonstrate a novel electronic transition at the two-dimensional limit through film thickness control.
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