Comparison and Validation of Different Magnetic Force Microscopy Calibration Schemes

Area of Science:

• Materials Science
• Nanotechnology
• Physics

Background:

• Reliable fabrication of nanostructures is vital for consumer electronics.
• Nanoscale characterization techniques are crucial for materials and device development.
• Magnetic Force Microscopy (MFM) allows localized study of magnetic field patterns down to 10 nm.

Purpose of the Study:

• To advance quantitative Magnetic Force Microscopy (MFM) as a standard nanocharacterization tool.
• To demonstrate the reliability and ease of use of a novel MFM calibration method.
• To validate the deconvolution algorithm for improved MFM accuracy.

Main Methods:

• Calibration of MFM using a magnetic reference sample with calculable stray field.
• Comparison of two calibration approaches: probe's effect on a graphene Hall sensor and MFM phase shift over microcoils.
• Application of a deconvolution algorithm using the open-source software Gwyddion.
• Numerical modeling to quantitatively link calibration measurements.

Main Results:

• Demonstrated reliability and ease of use for quantitative MFM calibration.
• Validated a calibration method combining reference samples and a deconvolution algorithm.
• Reported magnetic dipole approximations for common MFM probes.
• Showcased the applicability of the deconvolution algorithm with Gwyddion software.

Conclusions:

• Quantitative MFM is made more accessible for nanocharacterization laboratories.
• The presented calibration method and deconvolution algorithm enhance MFM's reliability.
• This work facilitates more precise analysis of magnetic nanostructures.