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Updated: Dec 28, 2025

Detection of Architectural Distortion in Prior Mammograms via Analysis of Oriented Patterns
Published on: August 30, 2013
You Wu1, Xiaodong Zhang1, And Fengzhou Fang1
1State Key Laboratory of Precision Measuring Technology & Instruments, Centre of Micro/Nano Manufacturing Technology-MNMT, Tianjin University, Tianjin 300072, China.
This study introduces an improved fabric defect detection system for optical images, addressing challenges like multi-scale and blurred defects. The new detector enhances performance, particularly for occluded fabric flaws.
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