Current Trends in the Optical Characterization of Two-Dimensional Carbon Nanomaterials

Graphene and graphene-related materials have received great attention because of their outstanding properties like Young's modulus, chemical inertness, high electrical and thermal conductivity, or large mobility. To utilize two-dimensional (2D) materials in any practical application, an excellent characterization of the nanomaterials is needed as such dimensions, even small variations in size, or composition, are accompanied by drastic changes in the material properties. Simultaneously, it is sophisticated to perform characterizations at such small dimensions. This review highlights the wide range of different characterization methods for the 2D materials, mainly attributing carbon-based materials as they are by far the ones most often used today. The strengths as well as the limitations of the individual methods, ranging from light microscopy, scanning electron microscopy, transmission electron microscopy, scanning transmission electron microscopy, scanning tunneling microscopy (conductive), atomic force microscopy, scanning electrochemical microscopy, Raman spectroscopy, UV-vis, X-ray photoelectron spectroscopy, X-ray fluorescence spectroscopy, energy-dispersive X-ray spectroscopy, Auger electron spectroscopy, electron energy loss spectroscopy, X-ray diffraction, inductively coupled plasma atomic emission spectroscopy to dynamic light scattering, are discussed. By using these methods, the flake size and shape, the number of layers, the conductivity, the morphology, the number and type of defects, the chemical composition, and the colloidal properties of the 2D materials can be investigated.