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Updated: Dec 28, 2025

Demonstration of a Hyperlens-integrated Microscope and Super-resolution Imaging
Published on: September 8, 2017
Demonstration of electron focusing using electronic lenses in low-dimensional system
Chengyu Yan1,2,3, Michael Pepper4,5, Patrick See6
1London Centre for Nanotechnology, 17-19 Gordon Street, London, WC1H 0AH, United Kingdom. uceeya3@ucl.ac.uk.
Abstract:
We report an all-electric integrable electron focusing lens in n-type GaAs. It is shown that a pronounced focusing peak takes place when the focal point aligns with an on-chip detector. The intensity and full width half maximum (FWHM) of the focusing peak are associated with the collimation of injected electrons. To demonstrate the reported focusing lens can be a useful tool, we investigate the characteristic of an asymmetrically gate biased quantum point contact with the assistance of a focusing lens. A correlation between the occurrence of conductance anomaly in low conductance regime and increase in FWHM of focusing peak is observed. The correlation is likely due to the electron-electron interaction. The reported electron focusing lens is essential for a more advanced electron optics device.
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