Modeling and numerical study of the influence of imperfect interface properties on the reflection coefficient for...

The microelectronics industry is expressing an increased demand for the development of non-destructive tools and methods for health control and diagnostics in multilayered structures. The purpose of these tools is to detect problems such as delaminations, inclusions and microcracks. The aim of this paper is to study the effect of imperfect interfaces on the wave propagation in multilayered structures. This type of structure represents the typical architecture of many microelectronic components. This study will be based on the calculation of the reflection coefficient and the guided waves dispersion curves. The investigated structure is an isotropic trilayer where two metallic layers are bonded together by an adhesive layer made of an epoxy resin. Comparisons were performed in order to evaluate numerically the influence of several properties of the adhesive layer on the guided waves behavior. In addition, an imperfect viscoelastic interface layer model [1] has been implemented in order to simulate different adherence qualities between the metallic layers.